New Metrolog V25 Release: Faster, Simpler, More Reliable Quality Control 

v25, release, new

A redesigned interface, CAD-free programming, a built-in AI assistant, and a next-generation digital twin: discover the major advancements in this new release, designed to simplify the daily work of metrology engineers and quality control managers and accelerate your production. 

These new capabilities mark another step in our ongoing mission to simplify metrology, streamline production processes, and help manufacturers reach operational excellence.

This major release delivers three key pillars of innovation:   

An interface that adapts to you 

No more one-size-fits-all interface: you can now choose between Light, Dark, and System themes, based on your working environment and preferences. 

What this means for youreduced eye strain during long inspection sessions, a more enjoyable day-to-day experience, and faster icon recognition thanks to a harmonized design, meaning a shorter learning curve for new team members. 

Program without CAD model 

Often working without a CAD model? CAD-free programming now lets you define nominal values directly through probing, with a new clearance mode ensuring collision-free trajectories. 

What this means for youa CMM program can now be built through simple manual teaching, without a prior modeling step, a real time saver for teams in the field, particularly in markets where CAD isn’t always available. Avoid going back and forth between the CMM and the computer, for more productivity .

Copilot Inside: instant answers, without leaving your software 

An AI chat assistant is now built directly into Planner, Silma, and Metrolog. No more searching through documentation, interrupting a colleague, or calling support. 

What this means for you: your teams can ask questions in natural language and get instant guidance on features and workflows, without ever leaving the application. Less time lost, more autonomy. 

Digital Twin++: closer synchronization with reality 

The digital twin takes a further step forward with real-time synchronization between the virtual and physical worlds, giving you greater confidence when building your programs: real-time head axis position tracking via the UCC server, Clearance Box now available with I++, the possibility of managing SNSLCT and HEADCS  in DMIS language and Path Planning extended to additional heads. 

What this means for you: better anticipation of trajectories and tool configurations, laying the groundwork for future Revo / PH20 use cases. 

Many other Optimizations 

This release also strengthens hardware compatibility and sharpens measurement precision across your inspection workflows. 

Broader hardware compatibility 

  • Metrologic DCS now integrates the latest Scanology devices, enabling manual scanning scenarios for both tracked and handheld systems directly within Metrolog — with acquisition handled natively, and no need to switch tools mid-scenario. 
  • The latest Creaform API has also been integrated, bringing full support for the Handyscan Evo alongside continued compatibility with existing scanners and their latest fixes and improvements. 
  • A new confocal sensor is now supported on ESPI CMMs, at the request of our partner OEM and shared customers, letting users switch freely between touch and non-contact probing depending on the part being measured. 

Sharper measurement precision 

→ More ergonomic section measurement 

A new 3D Envelope ball compensation mode is now available on section scans uses two or three measured sections, to compensate each one against all the probing points combined, improving accuracy and repeatability for thin blade measurements with high point density. 

Programming is also faster thanks to a new Proj On CAD parameter, which unlocks more projection combinations directly from the measurement window without extra construction steps. 

A new Flow Direction parameter completes this update, ensuring Leading Edge and Trailing Edge are always calculated correctly, with both automatic and custom modes available depending on the geometry. 

→ Simpler color mapping  

Color mapping can now be deactivated with new parameters, no more need to turn it off every time a new surface is retrieved. 

→ Point cloud generation from image data gains new flexibility :  

Users can now choose between Threshold and Canny (sub-pixel) algorithms, with new correction parameters offering finer control over 2D image compensation before generating point clouds. 

Want to know more? 

These new capabilities are just a glimpse of everything included in this release. Contact our team to find out how they can boost quality and efficiency in your own production. 

Ready for V25

We're closing the loop on quality at IMTS 2026 — Sept 14–19

Too many correction loops? The Manufacturing Quality Pack is now live.

OUT NOW : Inspection Flow is live. Centralize your metrology data and close the quality loop.